Harmonized System

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Show last update onlyCorrelation Tables

Section XVIII > Chapter 90 > Heading 9030 > 9030.40

Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)

Section XVIII > Chapter 90 > Heading 9030 > 9030.8 > 9030.82

For measuring or checking semiconductor wafers or devices (including integrated circuits)

Section XVIII > Chapter 90 > Heading 9030 > 9030.8 > 9030.84

Other, with a recording device

Section XVIII > Chapter 90 > Heading 9030 > 9030.8 > 9030.89

Other

Section XVIII > Chapter 90 > Heading 9030 > 9030.90

Parts and accessories

Section XVIII > Chapter 90 > Heading 9031 > 9031.4

Other optical instruments and appliances 

Section XVIII > Chapter 90 > Heading 9031 > 9031.10

Machines for balancing mechanical parts

Section XVIII > Chapter 90 > Heading 9031 > 9031.20

Test benches

Section XVIII > Chapter 90 > Heading 9031 > 9031.4 > 9031.41

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

Section XVIII > Chapter 90 > Heading 9031 > 9031.4 > 9031.49

Other

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