Système harmonisé
Section XVIII > Chapitre 90 > Position 9030 > 9030.8 > 9030.82
For measuring or checking semiconductor wafers or devices (including integrated circuits)
Section XVIII > Chapitre 90 > Position 9030 > 9030.8 > 9030.84
Other, with a recording device
Section XVIII > Chapitre 90 > Position 9030 > 9030.90
Parts and accessories
Section XVIII > Chapitre 90 > Position 9031 > 9031.4
Other optical instruments and appliances
Section XVIII > Chapitre 90 > Position 9031 > 9031.10
Machines for balancing mechanical parts
Section XVIII > Chapitre 90 > Position 9031 > 9031.4 > 9031.41
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Section XVIII > Chapitre 90 > Position 9031 > 9031.80
Other instruments, appliances and machines